IEEE Boston Reliability

"From Expert Judgement to AI: Knowledge Graph Approach to Failure Mode and Effects Analysis (FMEA)"
Presentation tomorrow (Wednesday) at MIT Lincoln Laboratory
Registration is free, but required, so that we can plan refreshments.
Details are on the registration page:
https://events.vtools.ieee.org/m/549848

This event is open to IEEE and non-IEEE members.

Please click the link above today, before registration closes.

Complete abstract and bio are on the registration page.
Portions are pasted below.

Failure Mode and Effects Analysis (FMEA) is a foundational method in reliability engineering for identifying potential failures, assessing their impacts, and guiding risk mitigation
This presentation explores a knowledge-graph–based framework that extends traditional FMEA into a knowledge reasoning system.
By combining established FMEA practices with knowledge graphs and AI reasoning, this approach aims to enhance the depth, speed, and adaptability of reliability analysis.

Mason Pishahang, PhD
Design for Safety and Reliability (DfSR) Regional Lead for North America
Schneider Electric
Collaborates with engineering teams to ensure that products and systems are designed to meet rigorous standards of safety and reliability
Work focuses on the development of tools and analytical frameworks aimed at improving the safety and reliability of complex engineering systems through the application of artificial intelligence and data-driven methodologies.
Master of Science degrees in Mining Engineering and Mechanical Engineering
M.S. and Ph.D. degrees in Civil Engineering from UCLA

On Wednesday March 11, 2015, in the evening, IEEE Reliability Chapter will have meeting presentation for IEEE members and non-members at MIT Lincoln Laboratory in Lexington, MA. Presentation topic is"System Impact of Reliability," by Daniel J. Weidman, Ph.D of MIT Lincoln Laboratory, MA.
Please visit IEEE Boston Reliability site for details and registration. Registration is required so that we can plan the pizza and beverages, but this event is free of charge. http://ewh.ieee.org/r1/boston/rl/events.html.

IEEE Boston Reliability Chapter February Meeting re-scheduled for Tuesday February 17th, 2015 at MIT Lincoln Lab., Lexington, MA.
Meeting presentation "Recent Progress in Understanding the Electrical Reliability of GaN High-Electron Mobility Transistors" by Jesus A. del Alamo, Director - Microsystems Technology Laboratory, MIT.
Please register at http://ewh.ieee.org/r1/boston/rl/events.html.

Hello All,
Chapter AdCom has decided to cancel monthly meeting tomorrow Feb 10th, 2015 due to continued snow emergencies in Boston, surrounding communities and cancellation of public transportation. Information on re-scheduling of meeting will be posted soon.
Thanks.

Stay warm and Safe!
IEEE Boston Rel-Soc
AdCom 2015

IEEE Reliability Chapter presentation on February 10, 2015, in the evening at MIT Lincoln Laboratory in Lexington, MA.
"Recent progress in understanding the electrical reliability of GaN High-Electron Mobility Transistors," by Prof. Jesús A. del Alamo, who is Director of the Microsystems Technology Laboratories at Massachusetts Institute of Technology.
Meeting is open for IEEE members and non-members. Please visit our web site soon for details and registration. Registration is required so AdCom can plan the pizza and beverages,but this event is free of charge. http://ewh.ieee.org/r1/boston/rl/events.html

IEEE Boston Reliability Chapter Enter description of page

IEEE-Reliability Society Past Chairs Annual Dinner meeting Pictures captured on 12/10/2014.

On Wednesday, December 10, 2014, evening, IEEE Reliability Chapter meeting at MIT Lincoln Laboratory in Lexington, MA: "Reliability As Impacted by Phased-Array and Radar Breakthroughs," by Eli Brookner, who is an internationally recognized radar expert, author of four books, recently retired from Raytheon, and IEEE Distinguished Lecturer. Please visit chapter web site to find additional details http://ewh.ieee.org/r1/boston/rl/events.html

Reliability Society's monthly chapter meeting resumes on September 10, 2014 at 6.00PM with presentation on "Maintaining Quality and Reliability of a Complex Product through a Global Manufacturing Transfer” by Kevin Foy.

Kevin Foy will talk about moving leak detector builds from Lexington to Malaysia. Transferring a complex product from its design site to a LCC (Low Cost Country) manufacturing site is a difficult task. Performing the transfer without affecting Quality & Reliability is more difficult. This presentation will cover the Verification and Validation tasks necessary to assure the MTBF (Mean Time Between Failures), MTTF (Mean Time to Failure), and AFR (Annualized Failure Rate) metrics are maintained and/or improved during this time period. An actual example that was used at Agilent Technologies will be reviewed.
The meeting will take place at MIT Lincoln Labs, Main Cafeteria., 244 Wood Street, Lexington, MA. For meeting registration visit site http://www.ieee.org/bostonrel. Registration is required so that we can plan the pizza and beverages, but there is no charge to attend.

IEEE Boston Reliability Chapter Welcome to IEEE Boston Reliability Chapter's official website for meetings, presentations, networking and information about reliability and related topics for professionals and the others in the Boston area, New Hampshire and Providence, RI.

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IEEE Boston Reliability Chapter Welcome to the IEEE Boston Reliability Chapter. We have monthly presentations, usually at MIT Lincoln Laboratory. Find us by Googling "IEEE Boston Reliability" or searching Facebook for "IEEE Boston Reliability"

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IEEE BOSTON SECTION - CHAPTER LEADERSHIP SKILLS WORKSHOP
Date: Thursday, June 19, 2014
Time: 5:00 – 8:30 pm
Place: MIT Lincoln Lab Cafeteria, 244 Wood St. Lexington, MA 02420

Agenda:
Models of vibrant chapters
Assessing chapter needs and skills
Outreach to members/non-members/community/institutions/corporations
Chapter society and Boston section support
IEEE online resources
Chapter level core executive committee
Volunteer recruitment and development – the buddy system
Membership retention
Program planning – talks and trips
Chapter recognition – awards and T-shirts
Succession planning
Group planning among chapters and societies
Sharing best practices among chapters

Open to All IEEE Members
Light dinner provided.

RSVP to Linda Scott at IEEE Boston Section by June 18th