Clemson University Electron Microscope Facility

Located 3.5 miles north of I-85 on SC 187, our EM Facility has several state-of-art high resolution transmission electron microscopes (3 Hitachi TEMs, HT7830, H9500 and HD2000), scanning electron microscopes (6 Hitachi SEMs, S3400, S4800, SU6600, SU5000, SU9000, TM3000) and a combined Focused Ion Beam (FIB)/SEM Hitachi NB5000 microscope. We also have advanced Physical Electronics (VersaProbe-III)

X-ray Photoelectron Spectroscopy (XPS) combined with Auger Electron Spectroscopy (AES) capability for surface science studies. In addition, there is a Porosimeter for BET analysis and surface area measurements. Our goal is to provide best microscopy and surface science analytical services to our faculty and industrial collaborators. We frequently use Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength dispersive spectroscopy (WDS), sample manipulation and surface modification capabilities installed on our electron microscopes. Our multi-user facility attracts clients from aerospace, automotive, pharmaceutical, textile, electronics, environmental and medical industries from within and outside our state borders. The affordable cost, wide range of capabilities and minimum wait time make the EM facility attractive for regional industry and academic researchers.