MNIL, KAIST

MNIL, KAIST

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Contact information, map and directions, contact form, opening hours, services, ratings, photos, videos and announcements from MNIL, KAIST, Community College, 대전광역시 유성구 대학로 291, Daejeon.

27/12/2025

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31/03/2025

Photos from MNIL, KAIST's post 27/12/2024

#2024

Photos from MNIL, KAIST's post 06/12/2024

#지도학생 #수상

04/12/2024

CETPM Global BRL Seminar 1

Speaker: Prof. Jae Sung Park (University of Nebraska-Lincoln)
- Time: 2024.12.05 PM 4:00
- Place: SHI-KAIST Seminar Rm(N7-4, 1212)

Title: When fluid mechanics meets rheology and electrokinetics

Abstract: This talk will start by introducing diverse fluid-mechanics projects conducted in the Park research group at Nebraska, including complex fluids, laminar-to-turbulent transition, and turbulent drag reduction. I will then focus on complex fluids, where a concentrated suspension of highly conductive particles in an electric field is studied. The dynamics and rheology of such suspension become more complex as fluid mechanics is coupled with nonlinear electrokinetics. In particular, I will present our intriguing findings at high concentrations, which could be useful for many applications, especially suspension-based flow batteries and desalination processes. The intriguing findings include enhanced hydrodynamics diffusion and negative particle pressure. The shear viscosity of such suspensions is then examined, where the shear thickening starts to arise at a concentration of 30%. Lastly, we examine the influence of the magnitude, direction, and frequency of the electric field as a means of active rheology control.

02/12/2024

Photos from MNIL, KAIST's post 22/11/2024

Photos from MNIL, KAIST's post 11/11/2024

Facile extraction of scanning probe shape for improved deconvolution of tip-sample interaction artifacts - Micro and Nano Systems Letters 24/08/2024

https://mnsl-journal.springeropen.com/articles/10.1186/s40486-024-00207-z

Facile extraction of scanning probe shape for improved deconvolution of tip-sample interaction artifacts - Micro and Nano Systems Letters Atomic Force Microscopy (AFM) has intrinsic tip-sample convolution artifacts. Commercially available tip-check samples are used to obtain only the tip radius, which can be used to deconvolute surface profiles or to quantify tip wear by relying on AFM alone. When the sample height is of the order of....

Photos from MNIL, KAIST's post 17/08/2024

#2024

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대전광역시 유성구 대학로 291
Daejeon
34141